M.T. Al Qaseer (M.T. Ghasr), associate scientist at the Center for Nondestructive Evaluation (CNDE) and Reza Zoughi, director of CNDE, have been awarded a patent titled “Microwave Reflectometry for Physical Inspections.”
According to the patent abstract the invention is “utilizing microwave reflections to compare a reference device with counterfeit and / or aging devices under test. The reflection from the device under test varies based on certain properties, which results in each device having a unique and intrinsic electromagnetic signature. Comparisons of the electromagnetic signature of the device under test to the electromagnetic signature of a reference device enabled.”
Co-inventors listed on the patent are S. Shinde and S. Jothibasu. This work was performed when Al Qaseer and Zoughi were at Missouri University of Science and Technology (S&T).