CNDE researchers awarded patent for microwave reflectometry innovations

M.T. Al Qaseer (M.T. Ghasr), associate scientist at the Center for Nondestructive Evaluation (CNDE) and Reza Zoughi, director of CNDE, have been awarded a patent titled “Microwave Reflectometry for Physical Inspections.”

According to the patent abstract the invention is “utilizing microwave reflections to compare a reference device with counterfeit and / or aging devices under test. The reflection from the device under test varies based on certain properties, which results in each device having a unique and intrinsic electromagnetic signature. Comparisons of the electromagnetic signature of the device under test to the electromagnetic signature of a reference device enabled.”

Co-inventors listed on the patent are S. Shinde and S. Jothibasu. This work was performed when Al Qaseer and Zoughi were at Missouri University of Science and Technology (S&T).