College of Engineering News • Iowa State University

Texas Instruments adopts ECpE researcher’s testing algorithm

by Thane Himes High-performance semiconductors are individually tested to guarantee quality before they can be shipped to customers. This is done by inputting precisely known data values into a part, and measuring how the part responds to the input data. As Moore’s law continues to push up performance and push down prices, test time has …Continue reading “Texas Instruments adopts ECpE researcher’s testing algorithm”

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