A series of algorithms being developed by Aditya Ramamoorthy could make using atomic force microscopes (AFMs) significantly faster when imaging and characterizing soft materials. Ramamoorthy, assistant professor of electrical and computer engineering, has support from a $413,000 National Science Foundation (NSF) CAREER award to work on the project “Joint topographic imaging and characterization using atomic force …Continue reading “Improving the capabilities of atomic force microscopy”